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ASTM F 1467 : 2025 Standard Guide for Use of an X-Ray Tester (≈10 keV Photons) in Ionizing Radiation Effects Testing of Semiconductor Devices and Microcircuits
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| Committee | E 10 |
| DocumentType | Guide |
| Pages | 18 |
| PublisherName | American Society for Testing and Materials |
| Status | Current |
| Supersedes | ASTM F 1467 : 2018 |
R00003952
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ASTM F 1467 : 2025 Standard Guide for Use of an X-Ray Tester (≈10 keV Photons) in Ionizing Radiation Effects Testing of Semiconductor Devices and Microcircuits