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ASTM F 1263 : 2025 Standard Guide for Analysis of Overtest Data in Radiation Testing of Electronic Parts
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| Committee | E 10 |
| DocumentType | Guide |
| Pages | 3 |
| PublisherName | American Society for Testing and Materials |
| Status | Current |
| Supersedes | ASTM F 1263 : 2011 : R2019 |